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Tenne, R. ; Galun, E. ; Ennaoui, A. ; Fiechter, S. ; Ellmer, K. ; Kunst, M. ; Koelzow, C. ; Pettenkofer, C. ; Tiefenbacher, S. ; Scheer, R. ; Jungblut, H. ; Jaegermann, W. (1996)
Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy.
In: Thin Solid Films, 272 (1)
doi: 10.1016/0040-6090(95)06963-1
Article, Bibliographie

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