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Number of items: 6.

Tarnawski, Z. and Zakrzewska, K. and Kim-Ngan, N.-T. H. and Krupska, M. and Sowa, S. and Drogowska, K. and Havela, L. and Balogh, A. G. (2015):
Study of Ti, V and Their Oxides-Based Thin Films in the Search for Hydrogen Storage Materials.
In: Acta Physica Polonica A, 128 (2), pp. 431-440. ISSN 0587-4246, 1898-794X,
[Article]

Tarnawski, Z. and Zakrzewska, K. and Kim-Ngan, N.-T. H. and Krupska, M. and Sowa, S. and Drogowska, K. and Havela, L. and Balogh, A. G. (2015):
Hydrogen storage in Ti, V and their oxides-based thin films.
In: Advances in Natural Sciences: Nanoscience and Nanotechnology, 6 (1), pp. 013002. IOP Publishing, ISSN 2043-6262,
[Article]

Tarnawski, Z. and Kim-Ngan, Nhu-T. H. and Zakrzewska, K. and Drogowska, K. and Brudnik, A. and Balogh, A. G. and Kuzel, R. and Havela, L. and Sechovsky, V. (2013):
Hydrogen storage in Ti-TiO2 multilayers.
In: Advances in Natural Sciences: Nanoscience and Nanotechnology, 4 (2), pp. 025004. [Article]

Kim-Ngan, Nhu-T. H. and Havela, L. and Adamska, A. M. and Danis, S. and Pesicka, J. and Macl, J. and Eloirdi, R. and Huber, F. and Gouder, T. and Balogh, A. G. (2011):
Characterization of U-based thin films: the UFe2+xcase.
In: Journal of Physics: Conference Series, 303 (1), pp. 012012. IOP Publishing, ISSN 1742-6596,
[Article]

Kim-Ngan, N.-T. H. and Balogh, A. G. and Havela, L. and Gouder, T. (2010):
Ion beam mixing in uranium nitride thin films studied by Rutherford Backscattering Spectroscopy.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 268 (11-12), pp. 1875-1879. Elsevier Science Publishing Company, [Article]

Adamska, A. M. and Havela, L. and Danis, S. and Pesicka, J. and Macl, J. and Uhlirova, K. and Gouder, T. and Eloirdi, R. and Huber, F. and Kim-Ngan, N.-T. H. and Balogh, A. G. (2010):
Uranium compounds prepared by sputter deposition: UFe2+x.
In: Journal of Physics: Conference Series, 200 (1), pp. 012057. IOP Publishing, [Article]

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