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Number of items: 3.

Brandt, Michael and Krozer, and Schüßler, and Lin, and Simon, and Vogt, and Rodriguez, and Parmeggiani, and Grajal, (1998):
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
In: Reliability Center of Japan (RCJ) Symposium <1998, Tokyo>: Proceedings, [Conference or Workshop Item]

Lin, Chih-I. and Krozer, V. and Grajal, and Simon, A. and Hartnagel, H. L. (1997):
Schottky varactor diode optimation for frequency multipliers.
In: International Workshop on Terahertz Electronics <5, 1997, Grenoble>: Proceedings, [Conference or Workshop Item]

Brandt, Michael and Schüßler, and Krozer, and Grajal, and Hartnagel, (1997):
Transmission line pulse based reliability investigations of HBTs.
In: European Gallium Arsenide and Related III-V Compounds Applications Symposium <5, 1997, Bologna, Italy>: Proceedings. S. 105-108, [Conference or Workshop Item]

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