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Brandt, Michael ; Krozer, ; Schüßler, ; Lin, ; Simon, ; Vogt, ; Rodriguez, ; Parmeggiani, ; Grajal, (1998):
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
In: Reliability Center of Japan (RCJ) Symposium <1998, Tokyo>: Proceedings, [Conference or Workshop Item]
Lin, Chih-I. ; Krozer, V. ; Grajal, ; Simon, A. ; Hartnagel, H. L. (1997):
Schottky varactor diode optimation for frequency multipliers.
In: International Workshop on Terahertz Electronics <5, 1997, Grenoble>: Proceedings, [Conference or Workshop Item]
Brandt, Michael ; Schüßler, ; Krozer, ; Grajal, ; Hartnagel, (1997):
Transmission line pulse based reliability investigations of HBTs.
In: European Gallium Arsenide and Related III-V Compounds Applications Symposium <5, 1997, Bologna, Italy>: Proceedings. S. 105-108, [Conference or Workshop Item]