Vogt, A. ; Brandt, M. ; Sigurdardottir, A. ; Schüssler, M. ; Pena, D. ; Simon, A. ; Hartnagel, H. L. ; Rodewald, M. ; Roesner, M. ; Fuess, H. ; Goswami, S. N. N. ; Lal, K. (1997)
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics Reliability, 37 (10-11)
doi: 10.1016/S0026-2714(97)00141-8
Artikel, Bibliographie

Niranjana, S. ; Goswami, S. N. N. ; Lal, K. ; Vogt, Alexander ; Hartnagel, Hans L.
Hrsg.: Kumar, Vikram (1997)
Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates.
9. International Workshop on Physics of Semiconductor Devices. New Delhi, India (December 16-20, 1997)
Konferenzveröffentlichung, Bibliographie