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Jiang, L. and Jaegermann, W. and Pettenkofer, C. and Tomm, Y. and Iyoda, T. and Hashimoto, K. and Fujishima, A. (1997):
Reversible Cu deintercalation on layered chalcogenide surfaces with scanning probe techniques: Towards nanometer scale storage devices.
In: Advanced Materials, pp. 578-581, 9, ISSN 09359648,
[Article]

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