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Stark, R. W. and Stark, M. Bhushan, B. and Fuchs, H. (eds.) (2006):
Higher harmonics in dynamic atomic force microscopy.
In: Applied Scanning Probe Methods II, Springer, Heidelberg, [Book Section]

Kamischke, R. and Kollmer, F. and Fuchs, H. and Stark, R. and Heckl, W. and Benninghoven, A. (1999):
Chemical characterization of modified nanotips by TOF-SIMS and Laser-SNMS.
In: Proc. XII Conf. on Secondary Ion Mass Spectroscopy SIMS XII, Brussels, pp. 9-12, [Conference or Workshop Item]

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