Stark, R. W. ; Stark, M.
eds.: Bhushan, B. ; Fuchs, H. (2006)
Higher harmonics in dynamic atomic force microscopy.
In: Applied Scanning Probe Methods II
Book Section, Bibliographie

Kamischke, R. ; Kollmer, F. ; Fuchs, H. ; Stark, R. ; Heckl, W. ; Benninghoven, A. (1999)
Chemical characterization of modified nanotips by TOF-SIMS and Laser-SNMS.
Proc. XII Conf. on Secondary Ion Mass Spectroscopy SIMS XII. Brussels
Conference or Workshop Item, Bibliographie