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Number of items: 2.
Estevez-Rams, E. ; Penton, A. ; Martinez-Garcia, J. ; Fuess, Hartmut (2005)
The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals.
In: Crystal research and technology, 40
Article, Bibliographie
Estevez-Rams, E. ; Aragon-Fernandez, B. ; Fuess, Hartmut ; Penton-Madrigal, A. (2003)
Diffraction pattern of stacked layer crystals.
In: Physical review / B, 68
Article, Bibliographie