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Characterization of U-based thin films: the UFe2+xcase.
In: Journal of Physics: Conference Series, 303 (1)
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Adamska, A. M. ; Havela, L. ; Danis, S. ; Pesicka, J. ; Macl, J. ; Uhlirova, K. ; Gouder, T. ; Eloirdi, R. ; Huber, F. ; Kim-Ngan, N.-T. H. ; Balogh, A. G. (2010)
Uranium compounds prepared by sputter deposition: UFe2+x.
In: Journal of Physics: Conference Series, 200 (1)
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