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Tengeler, Sven ; Kaiser, Bernhard ; Ferro, Gabriel ; Chaussende, Didier ; Jaegermann, Wolfram (2018):
The (001) 3C SiC surface termination and band structure after common wet chemical etching procedures, stated by XPS, LEED, and HREELS.
In: Applied Surface Science, 427, pp. 480-485. Elsevier Science Publishing, ISSN 01694332,
DOI: 10.1016/j.apsusc.2017.08.220,
[Article]

Tengeler, Sven ; Kaiser, Bernhard ; Chaussende, Didier ; Jaegermann, Wolfram (2017):
(001) 3C SiC/Ni contact interface: In situ XPS observation of annealing induced Ni2Si formation and the resulting barrier height changes.
In: Applied Surface Science, 400, pp. 6-13. Elsevier Science Publishing, ISSN 01694332,
DOI: 10.1016/j.apsusc.2016.12.136,
[Article]

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