TU Darmstadt / ULB / TUbiblio

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: No Grouping | Item Type | Date | Language
Number of items: 1.

Siejkowski,, Waldemar and Calderero-Lopez, A: and Wieder, Thomas and Gärtner, Helmut (1991):
X-Ray Analysis of Oxidized and Sulfidized Thin Nickel Films.
17, In: Metalurgia I Odlewnictwo, pp. 427-434, [Article]

This list was generated on Tue Feb 18 00:22:51 2020 CET.