Hartnagel, Hans L. ; Mutamba, Kabula ; Brandt, Michael ; Yilmazoglu, Oktay (2002):
Verbindungshalbleitersensorik für mechatronische Systeme.
In: Mechatronische Systeme für den Maschinenbau : Ergebnisse aus dem Sonderforschungsbereich ... / Hrsg.: Rolf Isermann.- Weinheim: Wiley-VCH-Verl., 2002.- ISBN 3-527-27730-7.- S. 287-316, Weinheim, Wiley-VCH-Verl., [Book Section]

Brandt, Michael (2000):
Verbindungshalbleiter-Mikrosensorik mit integrierter Telemetrie und Zuverlässigkeit relevanter III-V-Bauelemente.
Aachen, Shaker, TU Darmstadt,
[Ph.D. Thesis]

Brandt, Michael ; Bachmann, ; Vogt, ; Fach, ; Mayer, ; Breuer, ; Hartnagel, (1998):
Highly sensitive AlGaAs/GaAs position sensors for measurement of tire tread deformation.
In: Electronics Letters, 34 (8), pp. 760-762. IEE, ISSN 0013-5194, e-ISSN 1350-911X,
DOI: 10.1049/el:19980520,
[Article]

Brandt, Michael ; Krozer, ; Schüßler, ; Lin, ; Simon, ; Vogt, ; Rodriguez, ; Parmeggiani, ; Grajal, (1998):
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
In: Reliability Center of Japan (RCJ) Symposium <1998, Tokyo>: Proceedings, [Conference or Workshop Item]

Brandt, Michael ; Schüßler, ; Parmeggiani, ; Lin, ; Simon, ; Hartnagel, (1997):
Thermal simulation and characterisation of the reliability of terahertz Schottky diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1663-1666, [Conference or Workshop Item]

Brandt, Michael ; Schüßler, ; Krozer, ; Grajal, ; Hartnagel, (1997):
Transmission line pulse based reliability investigations of HBTs.
In: European Gallium Arsenide and Related III-V Compounds Applications Symposium <5, 1997, Bologna, Italy>: Proceedings. S. 105-108, [Conference or Workshop Item]

Brandt, Michael ; Schüßler, ; Lin, ; Simon, ; Hartnagel, (1997):
Transmission line pulse based reliability investigations of THz Schottky diodes.
In: ESA Electronic Components Conference <3, 1997, Noordwijk, NL>: Proceedings. S. 29-34, [Conference or Workshop Item]

Brandt, Michael ; Krozer, ; Schüßler, ; Bock, ; Hartnagel, (1996):
Characterisation of reliability of compound semiconductor devices using electrical pulses.
In: Microelectronics and reliability. 36 (1996), S. 1891-1894, [Article]

Brandt, Michael ; Schüßler, ; Hartnagel, (1996):
Characterisation of the reliability of planar Schottky diodes for millimetre and submillimetre wave applications.
In: European Space Research and Technology Centre: ESA-ESTEC <1996, Noordwijk, NL>: Proceedings, [Conference or Workshop Item]