Kazimierski, P. ; Lehmberg, (1998)
Electrical conductivity measurements with submicrometer lateral resolution.
In: Surface & coatings technology. 98 (1998), S. 939-943
Article, Bibliographie
| Item Type: | Article |
|---|---|
| Erschienen: | 1998 |
| Creators: | Kazimierski, P. ; Lehmberg, |
| Type of entry: | Bibliographie |
| Title: | Electrical conductivity measurements with submicrometer lateral resolution |
| Language: | German |
| Date: | 1998 |
| Journal or Publication Title: | Surface & coatings technology. 98 (1998), S. 939-943 |
| Divisions: | 05 Department of Physics |
| Date Deposited: | 19 Nov 2008 16:19 |
| Last Modified: | 20 Feb 2020 13:29 |
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