Assmann, W. ; Ban-d'Etat, B. ; Bender, M. ; Boduch, P. ; Grande, P. L. ; Lebius, H. ; Lelièvre, D. ; Marmitt, G. G. ; Rothard, H. ; Seidl, T. ; Severin, D. ; Voss, K.-O. ; Toulemonde, M. ; Trautmann, C. (2017)
Charge-state related effects in sputtering of LiF by swift heavy ions.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 392
doi: 10.1016/j.nimb.2016.12.013
Article, Bibliographie
Abstract
Sputtering experiments with swift heavy ions in the electronic energy loss regime were performed by using the catcher technique in combination with elastic recoil detection analysis. The angular distribution of particles sputtered from the surface of LiF single crystals is composed of a jet-like peak superimposed on a broad isotropic distribution. By using incident ions of fixed energy but different charges states, the influence of the electronic energy loss on both components is probed. We find indications that isotropic sputtering originates from near-surface layers, whereas the jet component may be affected by contributions from depth up to about 150 nm.
| Item Type: | Article |
|---|---|
| Erschienen: | 2017 |
| Creators: | Assmann, W. ; Ban-d'Etat, B. ; Bender, M. ; Boduch, P. ; Grande, P. L. ; Lebius, H. ; Lelièvre, D. ; Marmitt, G. G. ; Rothard, H. ; Seidl, T. ; Severin, D. ; Voss, K.-O. ; Toulemonde, M. ; Trautmann, C. |
| Type of entry: | Bibliographie |
| Title: | Charge-state related effects in sputtering of LiF by swift heavy ions |
| Language: | English |
| Date: | 1 February 2017 |
| Publisher: | Elsevier Science Publishing |
| Journal or Publication Title: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
| Volume of the journal: | 392 |
| DOI: | 10.1016/j.nimb.2016.12.013 |
| URL / URN: | https://doi.org/10.1016/j.nimb.2016.12.013 |
| Abstract: | Sputtering experiments with swift heavy ions in the electronic energy loss regime were performed by using the catcher technique in combination with elastic recoil detection analysis. The angular distribution of particles sputtered from the surface of LiF single crystals is composed of a jet-like peak superimposed on a broad isotropic distribution. By using incident ions of fixed energy but different charges states, the influence of the electronic energy loss on both components is probed. We find indications that isotropic sputtering originates from near-surface layers, whereas the jet component may be affected by contributions from depth up to about 150 nm. |
| Uncontrolled Keywords: | Electronic energy loss, Sputtering, LiF, Jet component |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Ion-Beam-Modified Materials |
| Date Deposited: | 29 Dec 2017 12:21 |
| Last Modified: | 26 Sep 2018 14:24 |
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