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High-resolution X-ray diffraction study of free-standing gallium arsenide coiled membrane force sensors produced by micromachining

Lal, K. ; Goswami, N. ; Miao, J. ; Hartnagel, H. L. (1999)
High-resolution X-ray diffraction study of free-standing gallium arsenide coiled membrane force sensors produced by micromachining.
Conference or Workshop Item

Item Type: Conference or Workshop Item
Erschienen: 1999
Creators: Lal, K. ; Goswami, N. ; Miao, J. ; Hartnagel, H. L.
Type of entry: Bibliographie
Title: High-resolution X-ray diffraction study of free-standing gallium arsenide coiled membrane force sensors produced by micromachining
Language: English
Date: 1 January 1999
Series: Indo-Russian Workshop on Micromechanical Systems = SPIE Proceedings. Vol. 3903 (1999)
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:05
Last Modified: 14 Feb 2019 10:47
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