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Reversible Cu deintercalation on layered chalcogenide surfaces with scanning probe techniques: Towards nanometer scale storage devices

Jiang, L. ; Jaegermann, W. ; Pettenkofer, C. ; Tomm, Y. ; Iyoda, T. ; Hashimoto, K. ; Fujishima, A. (1997)
Reversible Cu deintercalation on layered chalcogenide surfaces with scanning probe techniques: Towards nanometer scale storage devices.
In: Advanced Materials, 9
Article, Bibliographie

Item Type: Article
Erschienen: 1997
Creators: Jiang, L. ; Jaegermann, W. ; Pettenkofer, C. ; Tomm, Y. ; Iyoda, T. ; Hashimoto, K. ; Fujishima, A.
Type of entry: Bibliographie
Title: Reversible Cu deintercalation on layered chalcogenide surfaces with scanning probe techniques: Towards nanometer scale storage devices
Language: English
Date: 1997
Journal or Publication Title: Advanced Materials
Volume of the journal: 9
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 19 Nov 2008 16:04
Last Modified: 20 Feb 2020 13:30
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