Goswami, S. N. N. ; Lal, ; Vogt, ; Hartnagel, (1997)
Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates.
Conference or Workshop Item
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1997 |
| Creators: | Goswami, S. N. N. ; Lal, ; Vogt, ; Hartnagel, |
| Type of entry: | Bibliographie |
| Title: | Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates |
| Language: | English |
| Date: | 1 January 1997 |
| Series: | International Workshop on Physics of Semiconductor Devices <1997, New Delhi>: Proceedings |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:04 |
| Last Modified: | 14 Feb 2019 10:48 |
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