Brandt, Michael ; Schüßler, M. ; Parmeggiani, E. ; Lin, C. ; Simon, A. ; Hartnagel, H. L. (1997)
Thermal simulation and characterisation of the reliability of terahertz Schottky diodes.
In: Microelectronics Reliability, 37 (10-11)
doi: 10.1016/S0026-2714(97)00134-0
Article, Bibliographie
Abstract
Pulsed stress reliability investigations have been carried out for Schottky diodes. A thermal characterisation of the devices is performed using a numerical, coupled electrical thermal SPICE simulator. Different degradation mechanisms have been identified investigated. A comparison between thermal stress and electrical stress shows an influence of the operating current density and the anode diameter on the device degradation. Analytical calculations, simulation results, and results from the Wunsch-Bell model have been compared.
| Item Type: | Article |
|---|---|
| Erschienen: | 1997 |
| Creators: | Brandt, Michael ; Schüßler, M. ; Parmeggiani, E. ; Lin, C. ; Simon, A. ; Hartnagel, H. L. |
| Type of entry: | Bibliographie |
| Title: | Thermal simulation and characterisation of the reliability of terahertz Schottky diodes |
| Language: | English |
| Date: | 1 October 1997 |
| Publisher: | Elsevier |
| Journal or Publication Title: | Microelectronics Reliability |
| Volume of the journal: | 37 |
| Issue Number: | 10-11 |
| DOI: | 10.1016/S0026-2714(97)00134-0 |
| Abstract: | Pulsed stress reliability investigations have been carried out for Schottky diodes. A thermal characterisation of the devices is performed using a numerical, coupled electrical thermal SPICE simulator. Different degradation mechanisms have been identified investigated. A comparison between thermal stress and electrical stress shows an influence of the operating current density and the anode diameter on the device degradation. Analytical calculations, simulation results, and results from the Wunsch-Bell model have been compared. |
| Additional Information: | 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Arcachon, France, 07. to 10.10.1997 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:04 |
| Last Modified: | 13 Jun 2023 09:27 |
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