Brandt, Michael ; Schüßler, ; Parmeggiani, ; Lin, ; Simon, ; Hartnagel, (1997):
Thermal simulation and characterisation of the reliability of terahertz Schottky diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1663-1666, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1997 |
| Creators: | Brandt, Michael ; Schüßler, ; Parmeggiani, ; Lin, ; Simon, ; Hartnagel, |
| Title: | Thermal simulation and characterisation of the reliability of terahertz Schottky diodes |
| Language: | English |
| Series: | European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1663-1666 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:04 |
| License: | [undefiniert] |
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