| Item Type: |
Book Section
|
| Erschienen: |
2016 |
| Editors: |
Fanucci, Luca ; Teich, Jürgen |
| Creators: |
Casper, Thorben ; De Gersem, Herbert ; Gillon, Renaud ; Gotthans, Tomas ; Kratochvíl, Tomáš ; Meuris, Peter ; Schöps, Sebastian |
| Title: |
Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries |
| Language: |
German |
| Book Title: |
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
| Publisher: |
IEEE |
| ISBN: |
978-3-9815370-6-2 |
| Divisions: |
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields)
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields) > Computational Engineering (from 01.01.2019 renamed Computational Electromagnetics)
Exzellenzinitiative
Exzellenzinitiative > Graduate Schools
Exzellenzinitiative > Graduate Schools > Graduate School of Computational Engineering (CE) |
| Event Title: |
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
| Date Deposited: |
10 Apr 2017 21:51 |
| URL / URN: |
http://ieeexplore.ieee.org/document/7459510 |
| Additional Information: |
TEMF-Pub-DB TEMF002530 |
| PPN: |
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| Corresponding Links: |
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| Export: |
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