Iida, Tsutomu ; Makita, Yunosuke ; Shima, Takayuki ; Kimura, Shinji ; Horn, Joachim ; Hartnagel, Hans L. ; Uekusa, Shin‐ichiro (1996)
C+-energy-dependent residual ion damage in GaAs: C grown by the low-energy ion-beam doping method.
In: Journal of Applied Physics, 80 (7)
doi: 10.1063/1.363306
Article, Bibliographie
| Item Type: | Article |
|---|---|
| Erschienen: | 1996 |
| Creators: | Iida, Tsutomu ; Makita, Yunosuke ; Shima, Takayuki ; Kimura, Shinji ; Horn, Joachim ; Hartnagel, Hans L. ; Uekusa, Shin‐ichiro |
| Type of entry: | Bibliographie |
| Title: | C+-energy-dependent residual ion damage in GaAs: C grown by the low-energy ion-beam doping method |
| Language: | English |
| Date: | 1996 |
| Publisher: | AIP Publishing |
| Journal or Publication Title: | Journal of Applied Physics |
| Volume of the journal: | 80 |
| Issue Number: | 7 |
| DOI: | 10.1063/1.363306 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:04 |
| Last Modified: | 13 Dec 2023 14:23 |
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