Horn, Joachim ; Vogt, ; Aller, ; Hartnagel, (1996):
Semiconductor heterostructure interface characterization using scanning tunneling microscope excited time-resolved luminescence.
In: Journal of vacuum science and technology. B 14 (1996), S. 820-823, [Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1996 |
| Creators: | Horn, Joachim ; Vogt, ; Aller, ; Hartnagel, |
| Title: | Semiconductor heterostructure interface characterization using scanning tunneling microscope excited time-resolved luminescence |
| Language: | German |
| Journal or Publication Title: | Journal of vacuum science and technology. B 14 (1996), S. 820-823 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:04 |
| License: | [undefiniert] |
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