TU Darmstadt / ULB / TUbiblio

Surface- and sidewall-damage of InP-based optoelectronic devices during reactive ion etching using CH4/H2

Böttner, Th. ; Kräutle, H. ; Kuphal, E. ; Miethe, K. ; Hartnagel, H. L. (1996)
Surface- and sidewall-damage of InP-based optoelectronic devices during reactive ion etching using CH4/H2.
Conference or Workshop Item

Item Type: Conference or Workshop Item
Erschienen: 1996
Creators: Böttner, Th. ; Kräutle, H. ; Kuphal, E. ; Miethe, K. ; Hartnagel, H. L.
Type of entry: Bibliographie
Title: Surface- and sidewall-damage of InP-based optoelectronic devices during reactive ion etching using CH4/H2
Language: English
Date: 1 January 1996
Book Title: International Conference on Indium Phosphide and Related Materials : 8, 1996, Schwäbisch Gmünd ; Proceedings
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:04
Last Modified: 10 Mar 2022 13:23
PPN:
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details