Lambert, Georg ; Bock, F. (1997):
Wavelet methods for texture defect detection.
In: International Conference on Image Processing <1997, Santa Barbara, Calif.>: Proceedings., 3, IEEE Signal Processing Soc. 1997, pp. 201-204, IEEE Signal Processing Soc. 1997, IEEE Signal Processing Soc. 1997, International Conference on Image Processing, Santa Barbara, Californien, USA, [Conference or Workshop Item]
Item Type: | Conference or Workshop Item |
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Erschienen: | 1997 |
Creators: | Lambert, Georg ; Bock, F. |
Title: | Wavelet methods for texture defect detection |
Language: | English |
Series: | International Conference on Image Processing <1997, Santa Barbara, Calif.>: Proceedings. |
Series Volume: | 3 |
Place of Publication: | IEEE Signal Processing Soc. 1997 |
Publisher: | IEEE Signal Processing Soc. 1997 |
Edition: | IEEE Signal Processing Soc. 1997 |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institut für Automatisierungstechnik und Mechatronik 18 Department of Electrical Engineering and Information Technology > Institut für Automatisierungstechnik und Mechatronik > Control Methods and Robotics |
Event Title: | International Conference on Image Processing |
Event Location: | Santa Barbara, Californien, USA |
Date Deposited: | 19 Nov 2008 16:04 |
License: | [undefiniert] |
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