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Favorable Combination of Schottky Barrier and Junctionless Properties in Field-Effect Transistors for High Temperature Applications

Krauss, Tillmann ; Wessely, Frank ; Schwalke, Udo (2016)
Favorable Combination of Schottky Barrier and Junctionless Properties in Field-Effect Transistors for High Temperature Applications.
PRiME 2016 / 230th Meeting of the Electrochemical Society (ECS). Honolulu, Hawaii, USA (02.-07.10.2016)
Conference or Workshop Item, Bibliographie

Item Type: Conference or Workshop Item
Erschienen: 2016
Creators: Krauss, Tillmann ; Wessely, Frank ; Schwalke, Udo
Type of entry: Bibliographie
Title: Favorable Combination of Schottky Barrier and Junctionless Properties in Field-Effect Transistors for High Temperature Applications
Language: English
Date: 7 October 2016
Event Title: PRiME 2016 / 230th Meeting of the Electrochemical Society (ECS)
Event Location: Honolulu, Hawaii, USA
Event Dates: 02.-07.10.2016
URL / URN: http://prime-intl.org/
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Date Deposited: 24 Oct 2016 08:15
Last Modified: 03 Jun 2018 21:28
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