Klett, Joachim ; Ziegler, Jürgen ; Radetinac, Aldin ; Kaiser, Bernhard ; Schäfer, Rolf ; Jaegermann, Wolfram ; Urbain, Félix ; Becker, Jan-Philipp ; Smirnov, Vladimir ; Finger, Friedhelm (2016)
Band engineering for efficient catalyst-substrate coupling for photoelectrochemical water splitting.
In: Phys. Chem. Chem. Phys., 18 (16)
doi: 10.1039/C5CP06230F
Article, Bibliographie
Abstract
To achieve an overall efficient solar water splitting device, not only the efficiencies of photo-converter and catalyst are decisive, but also their appropriate coupling must be considered. In this report we explore the origin of a voltage loss occurring at the interface between a thin film amorphous silicon tandem cell and the TiO2 corrosion protection layer by means of XPS. We find that the overall device can be disassembled into its primary constituents and that they can be analyzed separately, giving insight into the device structure as a whole. Thus, a series of model experiments were conducted, each representing a part of the complete device. We finally arrive at the conclusion, that the formation of a SiO2 interfacial layer between the TiO2 protection layer and the silicon cell gives rise to the voltage loss observed for the whole device.
| Item Type: | Article |
|---|---|
| Erschienen: | 2016 |
| Creators: | Klett, Joachim ; Ziegler, Jürgen ; Radetinac, Aldin ; Kaiser, Bernhard ; Schäfer, Rolf ; Jaegermann, Wolfram ; Urbain, Félix ; Becker, Jan-Philipp ; Smirnov, Vladimir ; Finger, Friedhelm |
| Type of entry: | Bibliographie |
| Title: | Band engineering for efficient catalyst-substrate coupling for photoelectrochemical water splitting |
| Language: | English |
| Date: | 20 January 2016 |
| Publisher: | Royal Society of Chemistry |
| Journal or Publication Title: | Phys. Chem. Chem. Phys. |
| Volume of the journal: | 18 |
| Issue Number: | 16 |
| DOI: | 10.1039/C5CP06230F |
| Abstract: | To achieve an overall efficient solar water splitting device, not only the efficiencies of photo-converter and catalyst are decisive, but also their appropriate coupling must be considered. In this report we explore the origin of a voltage loss occurring at the interface between a thin film amorphous silicon tandem cell and the TiO2 corrosion protection layer by means of XPS. We find that the overall device can be disassembled into its primary constituents and that they can be analyzed separately, giving insight into the device structure as a whole. Thus, a series of model experiments were conducted, each representing a part of the complete device. We finally arrive at the conclusion, that the formation of a SiO2 interfacial layer between the TiO2 protection layer and the silicon cell gives rise to the voltage loss observed for the whole device. |
| Additional Information: | This article is part of themed collection: Bunsentagung 2016: Basic Mechanisms in Energy Conversion |
| Divisions: | 11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology 11 Department of Materials and Earth Sciences > Material Science > Surface Science 07 Department of Chemistry > Eduard Zintl-Institut > Fachgebiet Anorganische Chemie 07 Department of Chemistry > Eduard Zintl-Institut > Physical Chemistry 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences 07 Department of Chemistry |
| Date Deposited: | 26 Apr 2016 09:22 |
| Last Modified: | 26 Apr 2016 09:22 |
| PPN: | |
| Funders: | Financial support of this project by the DFG priority program SPP 1613 as well as by the DFG Excellence Initiative, Darmstadt Graduate School of Energy Science and Engineering (GSC 1070) is gratefully acknowledged., A part of this work was financed by Evonik Industries AG, partially funded by the German Federal Ministry of Education and Research within the Project SusHy. |
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