Serwatzy, C. ; Abraham, M. ; Drews, D. ; Ehrfeld, W. ; Mayr, K. ; Noell, W. ; Marti, O. ; Hollricher, O. ; Hahne, Peter ; Ehmann, Ralf
ed.: Hasche, Klaus (1997)
Numerical Simulations and Microfabrication of a Multifunctional AFM-SNOM-Sensor.
2nd Seminar on Quantitative Microscopy: geometrical measurements in the micro- and nanometre range with far and near field methods. Wien, Austria (06.11.1997-07.11.1997)
Conference or Workshop Item, Bibliographie
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1997 |
| Editors: | Hasche, Klaus |
| Creators: | Serwatzy, C. ; Abraham, M. ; Drews, D. ; Ehrfeld, W. ; Mayr, K. ; Noell, W. ; Marti, O. ; Hollricher, O. ; Hahne, Peter ; Ehmann, Ralf |
| Type of entry: | Bibliographie |
| Title: | Numerical Simulations and Microfabrication of a Multifunctional AFM-SNOM-Sensor |
| Language: | English |
| Date: | 1997 |
| Place of Publication: | Bremerhaven |
| Publisher: | Wirtschaftsverl. NW, Verl. für Neue Wissenschaften |
| Book Title: | Proceedings of the 2nd Seminar on Quantitative Microscopy: geometrical measurements in the micro- and nanometre range with far and near field methods, on 6th and 7th November 1997 in Wien, Austria |
| Series: | PTB-Bericht F |
| Series Volume: | 30 |
| Event Title: | 2nd Seminar on Quantitative Microscopy: geometrical measurements in the micro- and nanometre range with far and near field methods |
| Event Location: | Wien, Austria |
| Event Dates: | 06.11.1997-07.11.1997 |
| Additional Information: | TEMF-Pub-DB TEMF000253 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields) |
| Date Deposited: | 14 Mar 2016 16:31 |
| Last Modified: | 01 Feb 2024 12:13 |
| PPN: | |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Send an inquiry |
Options (only for editors)
 |
Show editorial Details |
Drucken
Impressum