Brandt, Michael ; Krozer, ; Schüßler, ; Bock, ; Hartnagel, (1996)
Characterisation of reliability of compound semiconductor devices using electrical pulses.
In: Microelectronics and reliability. 36 (1996), S. 1891-1894
Article
| Item Type: | Article |
|---|---|
| Erschienen: | 1996 |
| Creators: | Brandt, Michael ; Krozer, ; Schüßler, ; Bock, ; Hartnagel, |
| Type of entry: | Bibliographie |
| Title: | Characterisation of reliability of compound semiconductor devices using electrical pulses |
| Language: | English |
| Date: | 1 January 1996 |
| Journal or Publication Title: | Microelectronics and reliability. 36 (1996), S. 1891-1894 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:03 |
| Last Modified: | 20 Feb 2020 13:31 |
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