Lotichius, Jan ; Wagner, Stefan ; Kupnik, Mario ; Werthschützky, Roland (2015)
Measurement Uncertainty of Time-Based and Voltage-Based Wheatstone Bridge Readout Circuits.
IEEE Sensors 2015. Busan, Südkorea (01.11.2015 - 04.11.2015)
Conference or Workshop Item
Abstract
We investigate the uncertainty of a time-based approach to read out Wheatstone bridge circuits and we compare it to the classical voltage-based approach. The time-based approach utilizes electrical discharge time when the resistive sensor is connected to a charged capacitor. We compare both approaches based on measurement uncertainty models. Analytical equations are given and calculated for two integrated circuits (IC), Acam PS09 (time-based) and Texas Instruments ADS1220 (voltage-based). Expected value and measurement uncertainty are derived for both IC and parameters sorted by effect size on measurement uncertainty. Both models yield a measurement uncertainty in the range of 0.01% for a relative resistance change r=1E−2.
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2015 |
| Creators: | Lotichius, Jan ; Wagner, Stefan ; Kupnik, Mario ; Werthschützky, Roland |
| Type of entry: | Bibliographie |
| Title: | Measurement Uncertainty of Time-Based and Voltage-Based Wheatstone Bridge Readout Circuits |
| Language: | English |
| Date: | 1 November 2015 |
| Event Title: | IEEE Sensors 2015 |
| Event Location: | Busan, Südkorea |
| Event Dates: | 01.11.2015 - 04.11.2015 |
| Abstract: | We investigate the uncertainty of a time-based approach to read out Wheatstone bridge circuits and we compare it to the classical voltage-based approach. The time-based approach utilizes electrical discharge time when the resistive sensor is connected to a charged capacitor. We compare both approaches based on measurement uncertainty models. Analytical equations are given and calculated for two integrated circuits (IC), Acam PS09 (time-based) and Texas Instruments ADS1220 (voltage-based). Expected value and measurement uncertainty are derived for both IC and parameters sorted by effect size on measurement uncertainty. Both models yield a measurement uncertainty in the range of 0.01% for a relative resistance change r=1E−2. |
| Divisions: | 18 Department of Electrical Engineering and Information Technology > Institute for Electromechanical Design (dissolved 18.12.2018) 18 Department of Electrical Engineering and Information Technology > Measurement and Sensor Technology 18 Department of Electrical Engineering and Information Technology |
| Date Deposited: | 04 Nov 2015 13:37 |
| Last Modified: | 04 Nov 2015 13:54 |
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