Tenne, R. ; Galun, E. ; Ennaoui, A. ; Fiechter, S. ; Ellmer, K. ; Kunst, M. ; Koelzow, C. ; Pettenkofer, C. ; Tiefenbacher, S. ; Scheer, R. ; Jungblut, H. ; Jaegermann, W. (1996)
Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy.
In: Thin Solid Films, 272 (1)
doi: 10.1016/0040-6090(95)06963-1
Article, Bibliographie
| Item Type: | Article |
|---|---|
| Erschienen: | 1996 |
| Creators: | Tenne, R. ; Galun, E. ; Ennaoui, A. ; Fiechter, S. ; Ellmer, K. ; Kunst, M. ; Koelzow, C. ; Pettenkofer, C. ; Tiefenbacher, S. ; Scheer, R. ; Jungblut, H. ; Jaegermann, W. |
| Type of entry: | Bibliographie |
| Title: | Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy |
| Language: | English |
| Date: | 1996 |
| Journal or Publication Title: | Thin Solid Films |
| Volume of the journal: | 272 |
| Issue Number: | 1 |
| DOI: | 10.1016/0040-6090(95)06963-1 |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Surface Science |
| Date Deposited: | 27 Apr 2015 08:08 |
| Last Modified: | 27 Apr 2015 08:08 |
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