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SXPS studies of single crystalline CdTe/CdS interfaces

Siepchen, B. and Schimper, H.-J. and Klein, Andreas and Jaegermann, W. (2013):
SXPS studies of single crystalline CdTe/CdS interfaces.
In: Journal of Electron Spectroscopy and Related Phenomena, 190, pp. 54-63. ISSN 03682048,
[Article]

Item Type: Article
Erschienen: 2013
Creators: Siepchen, B. and Schimper, H.-J. and Klein, Andreas and Jaegermann, W.
Title: SXPS studies of single crystalline CdTe/CdS interfaces
Language: English
Journal or Publication Title: Journal of Electron Spectroscopy and Related Phenomena
Journal volume: 190
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 28 Mar 2015 16:17
Official URL: http://dx.doi.org/10.1016/j.elspec.2013.05.004
Identification Number: doi:10.1016/j.elspec.2013.05.004
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