TU Darmstadt / ULB / TUbiblio

Time-Resolved Synchrotron XPS Monitoring of Irradiation-Induced Nitrobenzene Reduction for Chemical Lithography

Roodenko, K. ; Gensch, M. ; Rappich, J. ; Hinrichs, K. ; Esser, N. ; Hunger, R. (2007)
Time-Resolved Synchrotron XPS Monitoring of Irradiation-Induced Nitrobenzene Reduction for Chemical Lithography.
In: The Journal of Physical Chemistry B, 111 (26)
doi: 10.1021/jp072440j
Article, Bibliographie

Item Type: Article
Erschienen: 2007
Creators: Roodenko, K. ; Gensch, M. ; Rappich, J. ; Hinrichs, K. ; Esser, N. ; Hunger, R.
Type of entry: Bibliographie
Title: Time-Resolved Synchrotron XPS Monitoring of Irradiation-Induced Nitrobenzene Reduction for Chemical Lithography
Language: English
Date: 2007
Journal or Publication Title: The Journal of Physical Chemistry B
Volume of the journal: 111
Issue Number: 26
DOI: 10.1021/jp072440j
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 23 Mar 2015 18:00
Last Modified: 23 Mar 2015 18:00
PPN:
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details