Hoefle, Matthias ; Schneider, Katharina ; Penirschke, Andreas ; Cojocari, Oleg ; Jakoby, Rolf (2011)
Characterization and impedance matching of new high sensitive planar Schottky detector diodes.
German Microwave Conference (GeMIC) 2011.
Conference or Workshop Item, Bibliographie
Abstract
New high sensitive zero-bias Schottky detector diodes with low junction capacitance and differential resistance are characterized by applying DC and S-parameter measurements in W-band. The extracted parameters provide an accurate RF model for circuit simulations to design and realize an impedance matching network at 90 GHz to avoid standing waves in a diode detector as an essential part of high sensitive direct detection receivers.
Item Type: | Conference or Workshop Item |
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Erschienen: | 2011 |
Creators: | Hoefle, Matthias ; Schneider, Katharina ; Penirschke, Andreas ; Cojocari, Oleg ; Jakoby, Rolf |
Type of entry: | Bibliographie |
Title: | Characterization and impedance matching of new high sensitive planar Schottky detector diodes |
Language: | English |
Date: | March 2011 |
Event Title: | German Microwave Conference (GeMIC) 2011 |
Abstract: | New high sensitive zero-bias Schottky detector diodes with low junction capacitance and differential resistance are characterized by applying DC and S-parameter measurements in W-band. The extracted parameters provide an accurate RF model for circuit simulations to design and realize an impedance matching network at 90 GHz to avoid standing waves in a diode detector as an essential part of high sensitive direct detection receivers. |
Divisions: | 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics (IMP) > Microwave Engineering 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics (IMP) |
Date Deposited: | 27 Jan 2012 15:20 |
Last Modified: | 05 Mar 2013 09:58 |
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