Gesswein, H. ; Paul, F. ; Binder, J. R. ; Giere, A. (2007)
High resolution X-ray diffraction study of the microstructure of undoped and doped Ba0.6Sr0.4TiO3 thick films.
6th ANKA Users Meeting.
Conference or Workshop Item, Bibliographie
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2007 |
| Creators: | Gesswein, H. ; Paul, F. ; Binder, J. R. ; Giere, A. |
| Type of entry: | Bibliographie |
| Title: | High resolution X-ray diffraction study of the microstructure of undoped and doped Ba0.6Sr0.4TiO3 thick films |
| Language: | English |
| Date: | October 2007 |
| Place of Publication: | Karlsruhe |
| Event Title: | 6th ANKA Users Meeting |
| Divisions: | 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics (IMP) > Microwave Engineering 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics (IMP) |
| Date Deposited: | 27 Jan 2012 15:19 |
| Last Modified: | 05 Mar 2013 09:58 |
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