Vogt, Alexander ; Hartnagel, Hans L. ; Miehe, Gerhard ; Fuess, H. ; Schmitz, J. (1996)
Electrical and microstructure analysis of ohmic contacts to p- and n-type GaSb, grown by molecular beam epitaxy.
In: Journal of Vacuum Science and Technology B, 14
doi: 10.1116/1.588790
Article, Bibliographie
Item Type: | Article |
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Erschienen: | 1996 |
Creators: | Vogt, Alexander ; Hartnagel, Hans L. ; Miehe, Gerhard ; Fuess, H. ; Schmitz, J. |
Type of entry: | Bibliographie |
Title: | Electrical and microstructure analysis of ohmic contacts to p- and n-type GaSb, grown by molecular beam epitaxy |
Language: | English |
Date: | 1996 |
Publisher: | AIP Publishing |
Journal or Publication Title: | Journal of Vacuum Science and Technology B |
Volume of the journal: | 14 |
DOI: | 10.1116/1.588790 |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
Date Deposited: | 19 Nov 2008 16:00 |
Last Modified: | 13 Dec 2023 14:29 |
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