Rispal, Lorraine ; Schwalke, Udo (2008)
Structural and Electrical Characterization of Carbon Nanotube Field-Effect Transistors Fabricated by Novel Self-aligned Growth Method.
In: 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Article, Bibliographie
URL / URN: http://dx.doi.org/10.1109/DTIS.2008.4540244
| Item Type: | Article |
|---|---|
| Erschienen: | 2008 |
| Creators: | Rispal, Lorraine ; Schwalke, Udo |
| Type of entry: | Bibliographie |
| Title: | Structural and Electrical Characterization of Carbon Nanotube Field-Effect Transistors Fabricated by Novel Self-aligned Growth Method |
| Language: | English |
| Date: | 28 March 2008 |
| Journal or Publication Title: | 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) |
| URL / URN: | http://dx.doi.org/10.1109/DTIS.2008.4540244 |
| Additional Information: | 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), Tozeur, Tunesien, 25.-28.03.2008 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Date Deposited: | 29 Jun 2011 10:43 |
| Last Modified: | 08 May 2024 08:51 |
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