Schwalke, Udo (2009)
Yield, Reliability and Variability in the Nano-Era: Will Existing Approaches Survive?
14th IEEE European Test Symposium. Sevilla, Spanien (25.-29.05.2009)
Conference or Workshop Item, Bibliographie
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2009 |
| Creators: | Schwalke, Udo |
| Type of entry: | Bibliographie |
| Title: | Yield, Reliability and Variability in the Nano-Era: Will Existing Approaches Survive? |
| Language: | English |
| Date: | 29 May 2009 |
| Event Title: | 14th IEEE European Test Symposium |
| Event Location: | Sevilla, Spanien |
| Event Dates: | 25.-29.05.2009 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Date Deposited: | 29 Jun 2011 09:32 |
| Last Modified: | 22 May 2013 13:51 |
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