| Item Type: |
Conference or Workshop Item
|
| Erschienen: |
2002 |
| Creators: |
Kerber, Andreas ; Cartier, E. ; Pantisano, L. ; Degraeve, R. ; Kim, Y. ; Hou, A. ; Groeseneken, G. ; Maes, H. E. ; Schwalke, Udo |
| Type of entry: |
Bibliographie |
| Title: |
Charging Instability in n-Channel MOS-FETs with SiO2/HfO2 Gate Dielectric |
| Language: |
English |
| Date: |
7 December 2002 |
| Event Title: |
IEEE Semiconductor Interface Specialist Conference |
| Event Location: |
San Diego, CA, USA |
| Event Dates: |
05.-07.12.2002 |
| Divisions: |
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Date Deposited: |
27 Jun 2011 13:52 |
| Last Modified: |
05 Mar 2013 09:50 |
| PPN: |
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