Kim-Ngan, N.-T. H. ; Balogh, A. G. ; Brötz, J. ; Zajac, M. ; Korecki, J. (2010)
Interface Properties of Single and Bi-Layer Fe3O4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments.
In: Acta Physica Polonica A, 118 (4)
Article, Bibliographie
Abstract
Series of Fe3O4/MgO(001) and Fe3O4/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20¥150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV He+ ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV He+ ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one.
| Item Type: | Article |
|---|---|
| Erschienen: | 2010 |
| Creators: | Kim-Ngan, N.-T. H. ; Balogh, A. G. ; Brötz, J. ; Zajac, M. ; Korecki, J. |
| Type of entry: | Bibliographie |
| Title: | Interface Properties of Single and Bi-Layer Fe3O4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments |
| Language: | English |
| Date: | 2010 |
| Journal or Publication Title: | Acta Physica Polonica A |
| Volume of the journal: | 118 |
| Issue Number: | 4 |
| Abstract: | Series of Fe3O4/MgO(001) and Fe3O4/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20¥150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV He+ ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV He+ ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one. |
| Divisions: | 11 Department of Materials and Earth Sciences > Material Science > Material Analytics 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences |
| Date Deposited: | 06 Dec 2010 12:47 |
| Last Modified: | 05 Mar 2013 09:42 |
| PPN: | |
| Funders: | The financial support from German Academic Exchange Service (DAAD)-project D/08/07729 (between Germany and Poland) is highly acknowledged., N.-T.H.K.-N. acknowledges the financial support by the Ministry of Science and Higher Education (MNiSW project No. 651N-DAAD/2010/0)., A.G.B. acknowledges the financial support by German Research Foundation (DFG; SFB-595 project)., This work was supported in part by the Team Program of the Foundation for Polish Science co-financed by the EU European Regional Development Fund. |
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