Kamischke, R. ; Kollmer, F. ; Fuchs, H. ; Stark, R. ; Heckl, W. ; Benninghoven, A. (1999)
Chemical characterization of modified nanotips by TOF-SIMS and Laser-SNMS.
Proc. XII Conf. on Secondary Ion Mass Spectroscopy SIMS XII. Brussels
Conference or Workshop Item, Bibliographie
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1999 |
| Creators: | Kamischke, R. ; Kollmer, F. ; Fuchs, H. ; Stark, R. ; Heckl, W. ; Benninghoven, A. |
| Type of entry: | Bibliographie |
| Title: | Chemical characterization of modified nanotips by TOF-SIMS and Laser-SNMS |
| Language: | English |
| Date: | 1999 |
| Event Title: | Proc. XII Conf. on Secondary Ion Mass Spectroscopy SIMS XII |
| Event Location: | Brussels |
| Divisions: | UNSPECIFIED ?? fb99_csi~fg5 ?? Zentrale Einrichtungen |
| Date Deposited: | 09 Sep 2010 08:23 |
| Last Modified: | 05 Mar 2013 09:36 |
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