Wiesner, J. (1996):
High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relations to their effect on Jc.
In: Physica. C 268 (1996), S. 161-172, [Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 1996 |
| Creators: | Wiesner, J. |
| Title: | High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relations to their effect on Jc |
| Language: | English |
| Journal or Publication Title: | Physica. C 268 (1996), S. 161-172 |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences) |
| Date Deposited: | 19 Nov 2008 15:59 |
| License: | [undefiniert] |
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