Wiesner, J. (1996)
High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relations to their effect on Jc.
In: Physica. C 268 (1996), S. 161-172
Article, Bibliographie
| Item Type: | Article |
|---|---|
| Erschienen: | 1996 |
| Creators: | Wiesner, J. |
| Type of entry: | Bibliographie |
| Title: | High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relations to their effect on Jc |
| Language: | English |
| Date: | 1996 |
| Journal or Publication Title: | Physica. C 268 (1996), S. 161-172 |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences) |
| Date Deposited: | 19 Nov 2008 15:59 |
| Last Modified: | 20 Feb 2020 13:31 |
| PPN: | |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Send an inquiry |
Options (only for editors)
 |
Show editorial Details |
Drucken
Impressum