Killat, Dirk (1996):
Measurement and modelling of sensitivity and noise of MOS magnetic field effect transistors.
In: Proceedings of Eurosensors X, the 10th European Conference on Solid-State Transducers, Sept. 1996, Leuven, Belgium. S. 1261-1262, Heverlee, Belgium: Catholic Univ. Leuven, 1996, Heverlee, Belgium, Catholic Univ. Leuven, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1996 |
| Creators: | Killat, Dirk |
| Title: | Measurement and modelling of sensitivity and noise of MOS magnetic field effect transistors |
| Language: | English |
| Series: | Proceedings of Eurosensors X, the 10th European Conference on Solid-State Transducers, Sept. 1996, Leuven, Belgium. S. 1261-1262 |
| Place of Publication: | Heverlee, Belgium |
| Publisher: | Catholic Univ. Leuven |
| Edition: | Heverlee, Belgium: Catholic Univ. Leuven, 1996 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology |
| Date Deposited: | 19 Nov 2008 15:59 |
| License: | [undefiniert] |
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| Suche nach Titel in: | TUfind oder in Google |
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