Zaunert, Florian ; Endres, Ralf ; Stefanov, Yordan ; Schwalke, Udo (2006)
Evaluation of MOSFETs with Crystalline High-k Gate-dielectrics: Device Simulation and Experimental Data.
7th Symposium Diagnostics & Yield - Advanced Silicon Devices and Technologies for ULSI Era. Warschau, Polen (25.-28.06.2006)
Conference or Workshop Item, Bibliographie
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2006 |
| Creators: | Zaunert, Florian ; Endres, Ralf ; Stefanov, Yordan ; Schwalke, Udo |
| Type of entry: | Bibliographie |
| Title: | Evaluation of MOSFETs with Crystalline High-k Gate-dielectrics: Device Simulation and Experimental Data |
| Language: | English |
| Date: | 28 June 2006 |
| Event Title: | 7th Symposium Diagnostics & Yield - Advanced Silicon Devices and Technologies for ULSI Era |
| Event Location: | Warschau, Polen |
| Event Dates: | 25.-28.06.2006 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Date Deposited: | 20 Nov 2008 08:27 |
| Last Modified: | 26 Aug 2018 21:24 |
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