Schwalke, Udo ; Stefanov, Yordan ; Komaragiri, Rama Subrahmanyam ; Ruland, Tino (2003)
Electrical Characterisation of Crystalline Praseodymium Oxide High-K Gate Dielectric MOSFETs.
In: Proceedings of the 33rd European Solid State Device Research Conference (ESSDERC)
Article, Bibliographie
| Item Type: | Article |
|---|---|
| Erschienen: | 2003 |
| Creators: | Schwalke, Udo ; Stefanov, Yordan ; Komaragiri, Rama Subrahmanyam ; Ruland, Tino |
| Type of entry: | Bibliographie |
| Title: | Electrical Characterisation of Crystalline Praseodymium Oxide High-K Gate Dielectric MOSFETs |
| Language: | English |
| Date: | 18 September 2003 |
| Journal or Publication Title: | Proceedings of the 33rd European Solid State Device Research Conference (ESSDERC) |
| URL / URN: | http://dx.doi.org/10.1109/ESSDERC.2003.1256859 |
| Additional Information: | European Solid-State Device Research Conference (ESSDERC), Estoril, Portugal, 16.-18.09.2003 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Date Deposited: | 20 Nov 2008 08:24 |
| Last Modified: | 08 May 2024 08:29 |
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