TU Darmstadt / ULB / TUbiblio

Gate Engineering for High-K Dielectric and Ultra-thin Gate Oxide CMOS

Komaragiri, Rama Subrahmanyam ; Zaunert, Florian ; Schwalke, Udo (2004)
Gate Engineering for High-K Dielectric and Ultra-thin Gate Oxide CMOS.
11th Annual Workshop on Semiconductor Advances for Future Electronics (SAFE). Veldhoven, Niederlande (24.-25.11.2004)
Conference or Workshop Item, Bibliographie

Item Type: Conference or Workshop Item
Erschienen: 2004
Creators: Komaragiri, Rama Subrahmanyam ; Zaunert, Florian ; Schwalke, Udo
Type of entry: Bibliographie
Title: Gate Engineering for High-K Dielectric and Ultra-thin Gate Oxide CMOS
Language: English
Date: 25 November 2004
Event Title: 11th Annual Workshop on Semiconductor Advances for Future Electronics (SAFE)
Event Location: Veldhoven, Niederlande
Event Dates: 24.-25.11.2004
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Date Deposited: 20 Nov 2008 08:24
Last Modified: 05 Mar 2013 09:10
PPN:
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details