TU Darmstadt / ULB / TUbiblio

Sunlight stability of organic light emitting diodes

Heil, Holger ; Andress, G. ; Schmechel, Roland ; Seggern, Heinz von ; Steiger, Jürgen ; Bonrad, K. ; Spengard, R. (2005)
Sunlight stability of organic light emitting diodes.
In: Journal of applied physics, 97 (12)
Article, Bibliographie

Abstract

This paper reports on the photodegradation of organic light-emitting diodes (OLEDs) due to exposure to visible and near-ultraviolet light. Such exposure affects strongly the device performance, e.g., the electroluminescence intensity and the device current decrease considerably, however, the photoluminescence remains unaffected. This photodegradation was investigated on various production-relevant classes of high-quality polymer semiconductors with different energy gaps, i.e., a yellowish-green polyphenylenevinylene derivative, a red polyfluorene derivative, and a blue polyspiro derivative. It will be demonstrated that the action spectrum of the photodegradation is strongly correlated with the fundamental absorption of the polymer itself. The indium-doped tin oxide (ITO) polymer interface was identified as the interface where photodegradation takes place, while the bulk of each layer (ITO or polymer) turned out to be insensitive to irradiation with visible or near-ultraviolet light. Furthermore, it is demonstrated that the photoinduced damage can be suppressed by inserting appropriate interlayer systems.

Item Type: Article
Erschienen: 2005
Creators: Heil, Holger ; Andress, G. ; Schmechel, Roland ; Seggern, Heinz von ; Steiger, Jürgen ; Bonrad, K. ; Spengard, R.
Type of entry: Bibliographie
Title: Sunlight stability of organic light emitting diodes
Language: English
Date: June 2005
Journal or Publication Title: Journal of applied physics
Volume of the journal: 97
Issue Number: 12
URL / URN: http://dx.doi.org/10.1063/1.1935130
Abstract:

This paper reports on the photodegradation of organic light-emitting diodes (OLEDs) due to exposure to visible and near-ultraviolet light. Such exposure affects strongly the device performance, e.g., the electroluminescence intensity and the device current decrease considerably, however, the photoluminescence remains unaffected. This photodegradation was investigated on various production-relevant classes of high-quality polymer semiconductors with different energy gaps, i.e., a yellowish-green polyphenylenevinylene derivative, a red polyfluorene derivative, and a blue polyspiro derivative. It will be demonstrated that the action spectrum of the photodegradation is strongly correlated with the fundamental absorption of the polymer itself. The indium-doped tin oxide (ITO) polymer interface was identified as the interface where photodegradation takes place, while the bulk of each layer (ITO or polymer) turned out to be insensitive to irradiation with visible or near-ultraviolet light. Furthermore, it is demonstrated that the photoinduced damage can be suppressed by inserting appropriate interlayer systems.

Uncontrolled Keywords: indium compounds, organic semiconductors, polymers, organic light emitting diodes, electroluminescence, photoluminescence, energy gap, ultraviolet radiation effects
Additional Information:

SFB 595 D4

Divisions: 11 Department of Materials and Earth Sciences
DFG-Collaborative Research Centres (incl. Transregio)
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres
Zentrale Einrichtungen
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > D - Component properties
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > D - Component properties > Subproject D4: Fatigue of organic electronic devices
Date Deposited: 20 Nov 2008 08:24
Last Modified: 20 Feb 2020 13:24
PPN:
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details