Ahles, Marcus ; Ruhl, Tilmann ; Hellmann, Götz Peter ; Winkler, H. ; Schmechel, Roland ; Seggern, Heinz von (2005)
Spectroscopic ellipsometry on opaline photonic crystals.
In: Optics communications, 246 (1-3)
Article, Bibliographie
Abstract
In the present paper, the optical and structural properties of an opaline photonic crystal consisting of a closest packing of nanospheres have been studied via spectroscopic ellipsometry. This method allows for a non-destructive determination of the effective refractive index without any assumption on material properties. Further we are able to gather information about the structural constitution of the opal by introducing a multi-layer model. The layer distance and the maximum size of the nanospheres can be extracted.
Item Type: | Article |
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Erschienen: | 2005 |
Creators: | Ahles, Marcus ; Ruhl, Tilmann ; Hellmann, Götz Peter ; Winkler, H. ; Schmechel, Roland ; Seggern, Heinz von |
Type of entry: | Bibliographie |
Title: | Spectroscopic ellipsometry on opaline photonic crystals |
Language: | English |
Date: | 1 February 2005 |
Publisher: | Elsevier Science Publishing |
Journal or Publication Title: | Optics communications |
Volume of the journal: | 246 |
Issue Number: | 1-3 |
URL / URN: | http://www.sciencedirect.com/science/article/pii/S0030401804... |
Abstract: | In the present paper, the optical and structural properties of an opaline photonic crystal consisting of a closest packing of nanospheres have been studied via spectroscopic ellipsometry. This method allows for a non-destructive determination of the effective refractive index without any assumption on material properties. Further we are able to gather information about the structural constitution of the opal by introducing a multi-layer model. The layer distance and the maximum size of the nanospheres can be extracted. |
Uncontrolled Keywords: | Opal, Photonic crystal, Colloid, Ellipsometry |
Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Electronic Materials |
Date Deposited: | 20 Nov 2008 08:23 |
Last Modified: | 10 Apr 2024 07:27 |
PPN: | |
Funders: | The authors would like to thank the German Research Foundation DFG for the spectroscopic ellipsometer which is an item on loan.. |
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