Sigmund, Jochen ; Saglam, Mustafa ; Hartnagel, Hans L. ; Miehe, Gerhard ; Fuess, Hartmut (2002)
Influence of growth interruptions at AlSb/InAs interfaces on the atomic morphology and electron transport properties.
Conference or Workshop Item, Bibliographie
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2002 |
| Creators: | Sigmund, Jochen ; Saglam, Mustafa ; Hartnagel, Hans L. ; Miehe, Gerhard ; Fuess, Hartmut |
| Type of entry: | Bibliographie |
| Title: | Influence of growth interruptions at AlSb/InAs interfaces on the atomic morphology and electron transport properties |
| Language: | English |
| Date: | 2002 |
| Series: | International Conference on Molecular Beam Epitaxy <12, 2002, San Francisco, Calif.>: Digest ...- 2002 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:30 |
| Last Modified: | 14 Feb 2019 10:47 |
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