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Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy

Megej, Alexander ; Beilenhoff, Klaus ; Schuessler, M. ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy.
In: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646, Piscataway, NJ, IEEE Service Center, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2002
Creators: Megej, Alexander ; Beilenhoff, Klaus ; Schuessler, M. ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L.
Title: Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy
Language: English
Series: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646
Place of Publication: Piscataway, NJ
Publisher: IEEE Service Center
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:30
License: [undefiniert]
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