Sydlo, Cezary ; Saglam, Mustafa ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Hartnagel, Hans L. (2002)
Reliability investigations on HBV using pulsed electrical stress.
In: Microelectronics reliability, 42
Article, Bibliographie
| Item Type: | Article |
|---|---|
| Erschienen: | 2002 |
| Creators: | Sydlo, Cezary ; Saglam, Mustafa ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Hartnagel, Hans L. |
| Type of entry: | Bibliographie |
| Title: | Reliability investigations on HBV using pulsed electrical stress |
| Language: | English |
| Date: | 2002 |
| Journal or Publication Title: | Microelectronics reliability |
| Volume of the journal: | 42 |
| Additional Information: | Ebenfalls ersch. in: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <13, 2002, Bellaria>: Proceedings |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:30 |
| Last Modified: | 20 Feb 2020 13:27 |
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