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Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis

Nicolich, Jeffrey P. ; Lences, Z. ; Dreßler, W. ; Riedel, Ralf (2000)
Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis.
Joint Meeting of the 45th Annual Denver X-Ray Conference / Powder Diffraction Satellite Meeting of the XVIIth Congress of the International-Union-of-Crystallography. Denver, Colorado (08.08.1996-08.08.1996)
doi: 10.1023/A:1004727401914
Conference or Workshop Item, Bibliographie

Abstract

X-ray powder diffraction methods of phase quantification were adapted and compared to mixtures of -Si3N4 and -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results (less than 3% absolute deviation) can be achieved in minimal time using intensity normalization methods. Phase quantification using the Rietveld method requires significantly longer measuring time, evaluation time and expertise to obtain the same results.

Item Type: Conference or Workshop Item
Erschienen: 2000
Creators: Nicolich, Jeffrey P. ; Lences, Z. ; Dreßler, W. ; Riedel, Ralf
Type of entry: Bibliographie
Title: Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis
Language: English
Date: 2000
Publisher: KLUWER ACADEMIC PUBL, Netherlands
Journal or Publication Title: Journal of materials science
Issue Number: 6
Series: Journal of Materials Science
Series Volume: 35(6)
Event Title: Joint Meeting of the 45th Annual Denver X-Ray Conference / Powder Diffraction Satellite Meeting of the XVIIth Congress of the International-Union-of-Crystallography
Event Location: Denver, Colorado
Event Dates: 08.08.1996-08.08.1996
DOI: 10.1023/A:1004727401914
Abstract:

X-ray powder diffraction methods of phase quantification were adapted and compared to mixtures of -Si3N4 and -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results (less than 3% absolute deviation) can be achieved in minimal time using intensity normalization methods. Phase quantification using the Rietveld method requires significantly longer measuring time, evaluation time and expertise to obtain the same results.

Uncontrolled Keywords: Ceramics
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Dispersive Solids
Date Deposited: 19 Nov 2008 16:27
Last Modified: 22 Aug 2018 08:17
PPN:
Funders: Financial support by the federal ministry of education and research, Bonn, project number WTZ SLAX262.11 and the Fonds der Chemischen Industrie, Frankfurt, is gratefully acknowledged.
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