Nicolich, Jeffrey P. ; Lences, Z. ; Dreßler, W. ; Riedel, Ralf (2000)
Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis.
Joint Meeting of the 45th Annual Denver X-Ray Conference / Powder Diffraction Satellite Meeting of the XVIIth Congress of the International-Union-of-Crystallography. Denver, Colorado (08.08.1996-08.08.1996)
doi: 10.1023/A:1004727401914
Conference or Workshop Item, Bibliographie
Abstract
X-ray powder diffraction methods of phase quantification were adapted and compared to mixtures of -Si3N4 and -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results (less than 3% absolute deviation) can be achieved in minimal time using intensity normalization methods. Phase quantification using the Rietveld method requires significantly longer measuring time, evaluation time and expertise to obtain the same results.
Item Type: | Conference or Workshop Item |
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Erschienen: | 2000 |
Creators: | Nicolich, Jeffrey P. ; Lences, Z. ; Dreßler, W. ; Riedel, Ralf |
Type of entry: | Bibliographie |
Title: | Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis |
Language: | English |
Date: | 2000 |
Publisher: | KLUWER ACADEMIC PUBL, Netherlands |
Journal or Publication Title: | Journal of materials science |
Issue Number: | 6 |
Series: | Journal of Materials Science |
Series Volume: | 35(6) |
Event Title: | Joint Meeting of the 45th Annual Denver X-Ray Conference / Powder Diffraction Satellite Meeting of the XVIIth Congress of the International-Union-of-Crystallography |
Event Location: | Denver, Colorado |
Event Dates: | 08.08.1996-08.08.1996 |
DOI: | 10.1023/A:1004727401914 |
Abstract: | X-ray powder diffraction methods of phase quantification were adapted and compared to mixtures of -Si3N4 and -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results (less than 3% absolute deviation) can be achieved in minimal time using intensity normalization methods. Phase quantification using the Rietveld method requires significantly longer measuring time, evaluation time and expertise to obtain the same results. |
Uncontrolled Keywords: | Ceramics |
Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Dispersive Solids |
Date Deposited: | 19 Nov 2008 16:27 |
Last Modified: | 22 Aug 2018 08:17 |
PPN: | |
Funders: | Financial support by the federal ministry of education and research, Bonn, project number WTZ SLAX262.11 and the Fonds der Chemischen Industrie, Frankfurt, is gratefully acknowledged. |
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