Andersen, Mia ; Pivak, Yevheniy ; Papadimitriou, Vasilis ; Jiang, Tianshu ; Roddatis, Vladimir ; Molina-Luna, Leopoldo ; Conroy, Michele (2024)
Atomically stable cryogenic in situ biasing (S)TEM holder with precise temperature control over a wide range of temperatures.
In: Microscopy and Microanalysis, 30 (Suppl. 1)
doi: 10.1093/mam/ozae044.687
Article, Bibliographie
Abstract
Cryo scanning transmission electron microscopy (STEM) is becoming an indispensable tool for studying phase transitions in various quantum materials [1-3] at the atomic scale. A detailed characterization of a sample’s structural and electronic properties across phase transitions necessitates a sample holder with double tilt capability and a continuous temperature control of the specimen while maintaining a sample stability that enables atomic resolution imaging. Temperature control is achieved using microelectromechanical systems (MEMS)-based heating and biasing chips [4, 5] in combination with a dedicated cryo TEM sample holder.
| Item Type: | Article |
|---|---|
| Erschienen: | 2024 |
| Creators: | Andersen, Mia ; Pivak, Yevheniy ; Papadimitriou, Vasilis ; Jiang, Tianshu ; Roddatis, Vladimir ; Molina-Luna, Leopoldo ; Conroy, Michele |
| Type of entry: | Bibliographie |
| Title: | Atomically stable cryogenic in situ biasing (S)TEM holder with precise temperature control over a wide range of temperatures |
| Language: | English |
| Date: | 24 July 2024 |
| Publisher: | Oxford University Press |
| Journal or Publication Title: | Microscopy and Microanalysis |
| Volume of the journal: | 30 |
| Issue Number: | Suppl. 1 |
| DOI: | 10.1093/mam/ozae044.687 |
| Abstract: | Cryo scanning transmission electron microscopy (STEM) is becoming an indispensable tool for studying phase transitions in various quantum materials [1-3] at the atomic scale. A detailed characterization of a sample’s structural and electronic properties across phase transitions necessitates a sample holder with double tilt capability and a continuous temperature control of the specimen while maintaining a sample stability that enables atomic resolution imaging. Temperature control is achieved using microelectromechanical systems (MEMS)-based heating and biasing chips [4, 5] in combination with a dedicated cryo TEM sample holder. |
| Additional Information: | Physical Sciences Symposia: Advanced Imaging and Spectroscopy Beyond Room Temperature |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Advanced Electron Microscopy (aem) |
| Date Deposited: | 31 Jul 2024 06:46 |
| Last Modified: | 31 Jul 2024 06:46 |
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